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The 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2006

International scientific society has carried out the Conference "Beam Injection Assessment of Microstructure in Semiconductors" during 17 years starting from 1988. During this period the Conference was held in France (1988, 1991, and 2003), Italy (1993), Spain (1996), Germany (1998), Japan (2000). Appearance of these Conferences was due to the extremely intensive development of Hi-Tech for micro- nano- and optoelectronics and corresponding progress of characterization nondestructive local techniques caused by and adequate to this global event. At the same time the development of techniques based on the fine electron, photon, x-ray, ion, atomic, molecular beams and metallic nanoprobes is performed in the World. This is the scanning and transmission electron microscopy, tunneling, atomic- force and confocal microscopy, x-ray ion microanalysis, Auger and photoelectron spectroscopy, etc. Definitely these techniques are widely used, developed and specialized for characterization of nanomaterials, structures and devices for advanced electronics at any stage of fabrication.

Conference Dates

Monday 11 June - Friday 15 June 2006
The scope of the workshop is to provide a forum for the presentation and discussion of the latest theoretical and experimental developments in the area of defects and microstructures assessment in semiconductors by beam injection and related methods.

Topics of interest include, but are not limited to:

Characterization Methods
electron beam: cathodoluminescence, EBIC, SDLTS, STEM
light: Spatially resolved PL, LBIC, RAMAN, SIRM
SPM: STM, Photon-STM, AFM, scanning Kelvin microscopy, scanning capacitance microscopy, BEEM
Near-field : NFOM
Ion beam : SIMS, FIB, IBIC

For characterization semiconductors and nano-structures and in general any quantitative and analytical aspect of local beam injection assessment of defects and nano-structures in semiconductors. Special attention will be paid to the application of beam injection techniques related to problems in advanced semiconductor technologies, including process control and failure analysis.

The workshop will consist of invited and contributed papers and poster sessions.
The official language of the workshop is English.
The workshop will act as a forum for interaction between physicists and technologists working in this field in both fundamental research and industrial applications.

LOCATION

St- Peterburg, Russia
The conference will be held at A. F. Ioffe Physico- Technical institute of RAS and Join Research center "Material since and characterization in the advanced technologies"
The new characterization conglomerate supported by the new characterization equipment is developed. This conglomerate includes to itself the x-ray diffraction methods, transmission and scanning electron microscopy, x-ray photoelectron spectroscopy, scanning tunnel and atom-force spectroscopy, secondary-ion microscopy, Auger-spectroscopy, local cathodoluminescence, as well as the electrophysical characterization methods.
Among the equipment the Center has the transmission electron microscope JEM-2100F (Jeol), secondary-ion microzonde - microscope IMS7F Cameca, UHV scanning tunnel microscope. At present the new hi-resolution x-ray station D8 Discover (Bruker) is under starting as well as several more.

CONFERENCE CHAIMAN

S.G. Konnikov, PTI RAS, Russia

PROGRAM CHAIMAN

E. Yakimov, Inst. Microelec., Chernogolovka, Russia

INTERNATIONAL SCIENTIFIC COMMITTEE

M. Breese, Natl. Univ. Singapore, Singapore

O. Breitenstein, MPI of Microstructure Physics, Halle, Germany

A. Cavallini, Univ.Bologna, Italy

M. Kittler, IHP GmbH, Germany

S.G. Konnikov, PTI RAS, Russia

J. Piqueras, Univ. Compludense, Madrid, Spain

Z.J. Radzimski, SEH America, Vancouver, WA, USA

T. Sekiguchi, National Res. Inst. Metals, Japan

B. Sieber, Univ. Lille, France

J.W. Steeds, Univ. of Bristol, UK

N. Tabet, Univ. King Fahd, Saudi Arabia

H. Tomokage, Fukuoka Univ. Japan

M. Troyon, Universita de Reims-Champagne-Ardenne, France

E. Yakimov, Inst. Microelec., Chernogolovka, Russia

LOCAL SCIENTIFIC COMMITTEE

M.Zamoryanskaya, Ioffe Physiko-Technical Institute, Russia

A.Tolmachev, Ioffe Physiko-Technical Institute, Russia

R.Sokolov, Ioffe Physiko-Technical Institute, Russia

M.Averchenko, Ioffe Physiko-Technical Institute, Russia

I.Zamoryanskaya (secretary)

PRELIMINARY LIST OF INVITED TALKS

Daniel Araujo, France "Excitons and defects in homoepitaxial diamand films from cathodoluminescence of p-/p+ samples"

Daniela Cavalcoli, University of Bologna, Italy "Micro- and nano- structures in silicon investigated by DLTS and beam injection methods"

Hans-Joachim Fitting, Rostock University, Germany "Multimodal Luminescence Spectra of Ion Beam-implanted Silica"

Nicolas Grandjean, Ecole Polytechnique Fйdйrale de Lausanne, Switzerland "Nanostructures based on GaN".

Martin Kuball, University of Bristol , UK "High spatial resolution micro-Raman thermal mapping of GaN-based electronic devices and their defects"

Manuel J. Romero, National Renewable Energy Laboratory, USA "Nanoprobes for future generation of photovoltaics"

Paul Sellin, University of Surrey, UK "Ion Beam Induced Charge imaging for the characterisation of wide band gap semiconductors"

Sergei Zaitsev, IPMT RAS, Chernoglovka, Russia "Random losses approach and Monte-Carlo simulation of fast electron interaction with solids"

Alexander Titkov, Ioffe Physiko-Technical Institute "Electrostatic force microscopy of local charging effects in nano thin SiO2 layers with embedded Si nanocrystals"

Alexander Latyshev, Institute of Semiconductor Physics RAS, Novosibirsk, Russia "Formation and diagnostic of surface nanostructures by in situ reflection electron microscopy and atomic force microscopy"

PROCEEDINGS

Proceedings will be published in a regular Journal "Semiconductors"

ABSTRACT SUBMISSION

Authors wishing to contribute a paper should submit a one page abstracts in Englishby 1 April, 2006.

Additional details concerning the abstract preparation are in the Web site.

IMPORTANT DEADLINES

Abstract deadline - April 1,2006
Notification of acceptance - April 15 2006
Pre-Registration - May 1,2006
Hotel reservation - May 1,2006
Payment of registration fee - May 1, 2006

CONTACT

Ioffe Physico-Technical Institute, RAS
Polytechnicheskaya 26
St. Petersburg, 194021
Russia
Tel. +7(812)2479382
Fax.+7(812)2471017

The BIAMS2006 site is http://www.ioffe.ru/RT/BIAMS